Transmission Line Pulse Test System
The Impulse Semiconductor High Current Transmission Line Pulse (TLP) test system is the tool of
choice for extracting ESD parameters for transient protection devices in a package, or at wafer level.
With accuracy better than 100 milliohms at 40 amps peak current, the Impulse high current TLP is
specially tailored to the needs of today’s ESD device designers who must accurately measure low
values dynamic resistance irrespective of breakdown voltage.
for Impulse Semiconductor
Integrated Pulse Test Systems:
• Patented Impulse Semiconductor Discharge Network
• Stanford Research PS350 High Voltage power supply
( two shown)
• Hewlett Packard/Agilent 3488 switch matrix with
44471A relay card
• Accurate and cost effective Tektronix TDS380
Oscilloscope
• Agilent 34401 DVM
• Reliable National Instruments GPIB-USB_HS controller
• Optional Hewlett Packard 4145 Semiconductor
Parametric Analyzer (DC leakage SMU)
• Low Loss RG213 Charging Cable
• Sleek, space saving laptop computer running XP
operating system (not shown)
Test System Features and Specifications
• Easy to use Impulse Semiconductor software for system control
• Software selectable transmission line charging voltage attenuation
• Software selectable charging voltage start, step and stop parameters
• Impulse Semiconductor proprietary system calibration algorithm
• N-type Female bulkhead transmission line input and output ports
• Front panel switches and relay indicators for manual override or manual pulse
generation
• 40 amp current range for a short load
• 2500 volt range
• 100 milliohm dynamic resistance accuracy to 40 amps
• 1 nanosecond pulse rise times
• Laptop Computer controller running XP operating system
• Impulse Semiconductor proprietary system calibration algorithm
• DC leakage SMU hardware choice
• Positive only, negative only, or both PS350 high voltage power supplies
• Choice of laptop controller running XP operating system
• Microsoft Office software for data analysis
• Oscilloscope choice
• Probe customization service for wafer level characterization
• 1-10 ns pulse rise times (selected by customer)
• Pulse width range 500-30 nanoseconds (selected by customer)
• 40 amp peak current for short load
• Front panel switches for manual operation of leakage and stress modes
• Front panel relay position LED indicators
• Dual polarity transmission line high voltage charging operation
• User defined transmission line charging voltage attenuation
• Agilent 34401 input ports for DC leakage
• Triaxial BNC input ports for DC leakage
• Leakage circuit crowbar relay
• Transmission line Output Port N-type female bulkhead
• Transmission line Input Port N-type female bulkhead
• Two SHV input ports for dual high voltage power supplies